Facilitators:
[JM] Dr Joele Mira, PhD (Stellenbosch University), iThemba LABS NRF
[MS] Dr Muneer Sakildien, PhD (University of Jyvaskyla), iThemba LABS NRF
[SS] Dr Skye Segal, PhD (University of Cape Town), iThemba LABS NRF
[HB] Mr Hugo Barnard, MSc (Ghent University), iThemba LABS NRF
The Zoom link will be sent after registration.
An ONLINE short-course on Introduction to Accelerator Physics offered over three days on specialized topics tailored to suit post-graduate students (Honors – PhD), and junior research staff working on projects involving accelerators. A total of six lecture sessions will be offered in three days, with each session lasting three hours.
Course Co-ordinator: Hugo Barnard (e-mail: hbarnard@tlabs.ac.za)
Target group: Honors/masters/doctoral students, junior research staff working on projects involving accelerators
No. of lectures/contact sessions: 6 (3 hours each)
Course certificate to be issued:
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Attendance (provided attendance > 90 %)
Presentation venue: virtual (Zoom platform: Link to be sent to registered participants)
Course dates/times: 22 – 24 July, with a morning session (09h00 to 12h00) and an afternoon session (13h30 to 16h30)
Course registration deadline: 19 July 2024
Course registration link:
https://indico.tlabs.ac.za/event/136/registrations/107/
Contact for queries on course: Course Co-ordinator: hbarnard@tlabs.ac.za
Contact for general queries: SAINTS Co-ordinator, e-mail address: saintsadmin@tlabs.ac.za
Course Outline:
Six lecture sessions on specialized accelerator physics topics, 3-hours per lecture session
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Session 1: Ion Sources [SS]: 22 July 09h00 – 12h00
Definition of an of an ion source; Different particles types that can be produced with an ion source; Fundamental concepts such as beam intensity; Classification of ion sources; Ion Source used for Radionuclide Production and Radiobiology; Thermionic emission; Electron impact ionization; Collisions; Gyromotion in an ion source; Ion Sources used for Subatomic Physics research
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Session 2 Accelerators [MS]: 22 July 13h30 – 16h30
Types of linear accelerators; Van der Graaff; The Tandetron; Types of circular accelerators; The resonance principle in a cyclotron; Magnetic focusing; Electric focusing; The phase relations during acceleration; Deflector
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Session 3: RF systems [HB]: 23 July 09h00 – 12h00
The RF resonators at iThemba LABS; Analogue components; Circuits; Transients; AC theory – Phasors, Impedance; Parallel resonant circuits; Series resonant circuits; Power; Q-factor; Capacitance and inductance of co-axial cables; Telegraph equations; Sine waves along a transmission line; Reflection at the load; Impedance of a load and a section of transmission line; Transmission lines as part of the RF oscillator
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Session 4: Beam Optics [JM]: 23 July 13h30 – 16h30
Introduction to beam emittance and Liouville’s theorem; Weak Focusing; Solenoid lens principle and derivation of equation of the focal point; Einzel lens principle and derivation of equation of focal point; Strong Focusing; Focusing principles of Electrostatic and Magnetic quadrupole lenses; Derivation of the magnetic field line equations; Derivation of the matrix equations for a first approximation to the focusing of quads; Derivation of the first order approximation for a drift space; Dipole Magnets; Principles of the dipole magnet; Derivation of the magnetic rigidity equation using energy relations equations
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Session 5: Magnets [HB]: 24 July 09h00 – 12h00
Introduction: History, Definition of terms, Units; Maxwell’s equations; Field lines; DC electromagnets – layout, yoke shapes; Dipole magnets, Quadrupole magnets; Materials, BH curves; Fringe fields and shims; Force on coils and yoke; Force on particles; Rigidity; Bending radius; Strength of B in magnet; Effective length; Beam uniformity; Measuring devices: rotating coil, hall probe, NMR; Designing a magnet analytically; FEA design
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Session 6: Beam Diagnostics [JM]: 24 July 13h30 – 16h30
Introduction – what are diagnostics; Types; Overview of the implementation at iThemba LABS; Time structure of a bunched beam; Diagnostics for Intensity; Diagnostics for Transverse properties; Diagnostics for Emittance; Diagnostics for Longitudinal parameters; Diagnostics for Beam energy
